Preface
1.Industrial Applications of Radiation Thermometry (J.
Hollandt, J. Hartmann, O. Struß, and R. Gärtner)
2. Experimental Characterization of Blackbody Radiation Sources
(S.N. Mekhontsev, A.V. Prokhorov, and L.M. Hanssen)
3. Radiation Thermometry in the Semiconductor Industry (B.E.
Adams, C.W. Schietinger, and K. G. Kreider)
4. Thermometry in Steel Production (T. Iuchi, Y. Yamada, M.
Sugiura, and A. Torao)
5. Thermal Imaging in Firefighting and Thermography
Applications (F. Amon and C. Pearson)
6. Remote Sensing of the Earth’s Surface Temperature (P.J.
Minnett and I. Barton)
7. Infrared and Microwave Medical Thermometry (E.F.J.
Ring, J Hartmann, K Ammer, R.Thomas, D. Land, J. Hand)
Appendix A. Fundamental and Other Physical Constants
Index
From 1993 until 2023 Benjamin Tsai worked as a physical scientist at NIST (National Institute of Standards and Technology) with research projects including the spectral irradiance scale, rapid thermal processing of semiconductor devices, heat flux, skin reflectance, UV exposure of reflectance standards, and photometry (measurement assurance program and research for luminous flux of LEDs).
"This reviewer was impressed by the scope and depth of coverage
afforded to this rapidly developing and very important class of
measurement techniques. Non-contact temperature measurement has
many applications, as it avoids contamination of the measured
material, can handle extremely high temperatures, and can usually
(but not always) be a nonintrusive measurement method. Many of the
pitfalls common in application of radiation thermometry are pointed
out in these volumes, and methods for avoiding the common errors in
application are given. These volumes should be a part of the
library of anyone using radiation thermometry in engineering
applications."--International Journal of Thermophysics
"This text is written for people using radiation thermometers in
industry and scientific research and designing thermometers for
particular applications. It provides summaries of recent practical
applications at a level accessible to the novice but with
sufficient technical depth to enable him or her to use them. It
contains numerous up-to-date references for those readers wanting
more details on a particular topic. Along with the first volume, it
would be an excellent resource for researchers and engineers
designing and using radiation thermometry devices."--IEEE
Electrical Insulation Magazine
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