Table of Contents

PART ONE: LEVERS AND NOISE
1: Mechanical Properties of Levers
2: Resonance Enhancement
3: Sources of Noises
PART TWO: SCANNING FORCE MICROSCOPES
4: Tunneling Detection Systems
5: Capacitance Detection Systems
6: Homodyne Detection Systems
7: Heterodyne Detection Systems
8: Laser-Diode Feedback Detection Systems
9: Polarization Detection Systems
10: Deflection Detection Systems
PART THREE: SCANNING FORCE MICROSCOPY
11: Electric Force Microscopy
12: Magnetic Force Microscopy
13: Atomic Force Microscopy

Reviews

From reviews of the first edition: 'instructive as to the capabilities and limitations of the STM, and should ignite the enthusiasm of those uncoverted to high resolution microscopy.' Journal of Colloid and Interface Science L'A valuable contribution to the literature, providing a sound theoretical basis.' Journal of Solid State Chemistry